• B-6, 2, Lorong Bayan Indah 3
  • Bay Avenue
  • 11900 Bayan Lepas, Penang
  • Malaysia
Company Profile
Dymek Company Ltd was established in 1989 and is an advanced equipment distributor to leading manufacturers and innovative R&D facilities in the Data Storage, Semiconductor, Optical, Photovoltaic and Aerospace industries. In the early 2000s, Dymek has expanded from our headquarters in Hong Kong across Asia, in order to meet the diverse needs of our customers. In today’s globalized marketplace, it is standard for our customers to have integrated supply chains that link countries across Southeast Asia. And our expert staff is prepared to meet them wherever they are.
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  • ThetaMetrisis - White Light Reflectance Spectroscopy (WLRS)
    Optical metrology tools for the characterization of single layer and multi-layer coatings for a wide range of diverse applications, such as: semiconductors, organic electronics, polymers, paints and coatings, photovoltaics, bio-sensing.
  • 4D Technology - Dynamic Interferometers & Portable Profilers
    Dynamic measurements ensure you can measure surface quality with high precision, even in an automated environment, or in the turbulence caused by a large separation between your part and the metrology system. It means you can attach your metrology system to a robot and sample at high speed, or take a measurement of a surface that is changing under stress.
  • Rtec Instruments - Tribometers & 3D Scratch Tester
    Rtec Instruments provides testing solutions for mechanical and optical surface characterization. Our innovative solutions cover tribology, scratch testing, adhesion, hardness, surface inspection, and much more.
  • Tau Science - Photovoltaic Solar Inspection Systems
    IRIS is an innovative, time-resolved thermography system capable of identifying solar cells with shunt defects (hot spots) in fewer than 300 milliseconds. PixEL is available as a high speed inline inspection module or as a customized research imaging platform that performs Photoluminescence, Electroluminescence and time-resolved infrared thermography.
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